TM 11-6625-2638-30
1-16. Electronic Assembly Scan Test Functional Description (fig. 1-8)
a. MODE switch S1 provides the scan mode commands and logic to the circuit card to cause servo output simula-
tions, and the modulator time constant to be generated.
b. SCAN switch S4 selects the azimuth servo commands and directs them as scanning commands to the circuit
card. The circuit card servo simulations of step a are synchronized by the scanning commands.
c. SCAN lamp DS5 comes on when the electronic assembly scan logic indicator output has been received.
d. DVM/SCOPE switch S3 selects the azimuth and elevation commands and discrete signals to be monitored at
the SCOPE test jacks.
e. FO from the electronic assembly is available for monitoring by a counter, at the FO test jack (J12).
f. CODE switch S2 provides the code select logic levels. TRACK, MLO, and Σ AT presence test jacks (J37, J35,
J39) provides access to the electronic assembly track discrete, MLO, and Σ AT signals.
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